๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The nano-scratch technique as a novel method for measurement of an interphase width

โœ Scribed by A. Hodzic; J. K. Kim; Z. H. Stachurski


Book ID
110240246
Publisher
Springer
Year
2000
Tongue
English
Weight
213 KB
Volume
19
Category
Article
ISSN
0261-8028

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES