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The Metal-Semiconductor Transition in Amorphous Si1−xCrx Films Detection of the Transition by Room-Temperature Measurements

✍ Scribed by A. Möbius

Publisher: John Wiley and Sons
Year: 1987
Tongue: English
Weight: 561 KB
Volume: 144
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.2221440236

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