The measurement of exonuclease activities by atomic force microscopy
β Scribed by K. Hori; T. Takahashi; T. Okada
- Publisher
- Springer
- Year
- 1998
- Tongue
- English
- Weight
- 826 KB
- Volume
- 27
- Category
- Article
- ISSN
- 1432-1017
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]
The interaction forces provided by silicone polyether (SPE) surfactants, adsorbed at the interface of octadecyltrichlorosilan monolayer and aqueous surfactant solution, were measured by atomic force microscopy. Changes in the forces in the presence of ethanol were examined for a series of comb-type
## Abstract ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a βFull Textβ option. The original article is trackable v
Direct measurements of the pull-off (adhesion) forces between pharmaceutical particles (beclomethasone dipropionate, a peptide-type material, and lactose) with irregular geometry and rough polymeric surfaces (series of polypropylene coatings, polycarbonate, and acrylonitrile-butadiene-styrene) were