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The measurement of “enhanced” L and M X-ray yields from charge-induced studies with protons and1H2+ion beams

✍ Scribed by A. E. Pillay; M. Peisach


Book ID
112676931
Publisher
Springer
Year
1995
Tongue
English
Weight
288 KB
Volume
189
Category
Article
ISSN
1588-2780

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