The measurement by IR spectrophotometry of the thickness of single- and double-layer dielectric coatings based on silica and silicon nitride

✍ Scribed by Yu. I. Kol'tsov; I. V. Korobov; N. G. Kol'tsova

• Publisher: Springer US
• Year: 1970
• Tongue: English
• Weight: 139 KB
• Volume: 12
• Category: Article
• ISSN: 0021-9037
• DOI: 10.1007/bf00614946