✦ LIBER ✦
The maximum dielectric strength of thin silicon oxide films : N. Klein and H. Gafni, IEEE Trans. Electron Devices, ED13, No. 12, February (1966), p. 281
- Publisher
- Elsevier Science
- Year
- 1967
- Tongue
- English
- Weight
- 102 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0026-2714
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