A study of different ageing classes via
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PΓ©rez-OcΓ³n, Rafael ;GΓ‘miz-PΓ©rez, M. Luz ;RuΓz-Castro, J. Eloy
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Article
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1997
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John Wiley and Sons
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English
β 84 KB
A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtai