✦ LIBER ✦
The latest features of heat shock testing equipment and thermal effects on semiconductors : Yoshikazu Kobayashi and Hironari Kawai. Proc. 18th Symp. Reliab. Maintainab. (Condensed Version), 86 (1988)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 123 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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