The investigation into charge degradation of MIS structures under strong electric field by a method of controlled current load

✍ Scribed by V. V. Andreev; V. G. Baryshev; G. G. Bondarenko; A. A. Stolyarov; V. A. Shakhnov

• Book ID: 110679239
• Publisher: Springer
• Year: 2000
• Tongue: English
• Weight: 623 KB
• Volume: 29
• Category: Article
• ISSN: 1063-7397
• DOI: 10.1007/bf02773241