The influences of electron and ion beam conditions on Auger carbon line shapes acquired on diamond and DLC films

✍ Scribed by W. Zhu; J.E. deVries; M.A. Tamor; K.Y. Simon Ng

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 660 KB
• Volume: 71
• Category: Article
• ISSN: 0257-8972
• DOI: 10.1016/0257-8972(94)02299-6