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The influence of the native BaAl2O4 boundary layer on microstructure and properties of YBa2Cu3O7−x thin films grown on sapphire

✍ Scribed by K. Dovidenko; S. Oktyabrsky; D. Tokarchuk; A. Michaltsov; A. Ivanov

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
864 KB
Volume
15
Category
Article
ISSN
0921-5107

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