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The influence of the interface states on the dynamic transconductance of mis-fets

✍ Scribed by Lothar Schrader


Book ID
107856256
Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
300 KB
Volume
20
Category
Article
ISSN
0038-1101

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📜 SIMILAR VOLUMES


The interface states analysis of the MIS
✍ A. Tataroğlu; Ş. Altındal 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 208 KB

The energy distribution of interface states (N ss ) and their relaxation time (s) were of the fabricated the Al/SiO 2 /p-Si (MIS) structures were calculated using the forward bias current-voltage (I-V), capacitance-frequency (C-f) and conductance-frequency (G-f) measurements. Typical ln[I/(1 À exp(À