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The influence of silicon on the crystallographic phases of the niobium-gallium system studied by x-ray diffraction methods

✍ Scribed by A. Herold; G. Försterling; K. Kleinstück; E. M. Savitski; Y. V. Yefimov; M. J. Bytschkova; B. N. Sumarokov

No coin nor oath required. For personal study only.

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