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The influence of preferred orientation on the line width and peak shift of (hk) interferences

โœ Scribed by Ruland, W. ;Tompa, H.

Book ID
114497912
Publisher
International Union of Crystallography
Year
1972
Tongue
English
Weight
624 KB
Volume
5
Category
Article
ISSN
0021-8898

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The texture of electrodeposited copper coatings has been investigated by X-ray (texture gonimeter) and galvanostatic methods. A dependence is found between the sequence of appearance of orientation axes and cd and temperature. The (111) texture axis appears only at high overvoltages (above O-132 V),