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The influence of microstructure on the probability of early failure in aluminum-based interconnects

✍ Scribed by Dwyer, V. M.

Book ID: 120664791
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 395 KB
Volume: 96
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1771825

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