The influence of mechanical stresses caused by structural defects on band structure and carrier mobility in thin films of the BiTeSb system: M P Volotskiy et al, Struct Defects in Semicon, Coll, Novosibirsk 1973, 98–101 (in Russian)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 167 KB
• Volume: 25
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(75)91552-3