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The Influence of Latency Jitter in Principal Component Analysis of Event-Related Potentials

✍ Scribed by Joachim Möcks

Book ID
111134358
Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
426 KB
Volume
23
Category
Article
ISSN
0048-5772

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Principal components analysis has been a widely used method for the analysis of eventrelated, electrical brain potentials (ERPs). Recent emphasis has been placed on measuring the topography of ERPs, as derived from the instantaneous measurements from multiple locations, and on defining diagnostic di