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The Influence of Interface Roughness on the Giant Magnetoresistance of Co/Cu Multilayer Films

✍ Scribed by Dorner, C. ;Haidl, M. ;Hoffmann, H.

Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
269 KB
Volume
145
Category
Article
ISSN
0031-8965

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πŸ“œ SIMILAR VOLUMES

Influence of the Roughness of the Buffer
Influence of the Roughness of the Buffer Layer on the Magnetoresistance of Co/Cu Multilayers
✍ Marsza?ek, M. ;Jaworski, J. ;Stachura, Z. ;Voznyi, V. ;BοΏ½lling, O. ;Sulkio-Cleff πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 196 KB πŸ‘ 2 views

We have studied the influence of the Pb buffer layer thickness in the Co/Cu multilayers on the magnetoresistance of the system. Co/Cu multilayers (ML) were thermally evaporated at very low deposition rates on Si substrates covered with Pb buffer layer of different thickness (5, 10, 20, 30, 40 nm). T