The influence of impurity on the critical thickness of the CeO2buffer layer for coated conductors

✍ Scribed by Min Pan; Zheng Huang; HuanFeng Ma; WeiRong Qiang; LianFu Wei; Long Wang; Yong Zhao

• Book ID: 107363384
• Publisher: Science in China Press (SCP)
• Year: 2009
• Tongue: English
• Weight: 509 KB
• Volume: 52
• Category: Article
• ISSN: 1672-1799
• DOI: 10.1007/s11433-009-0141-y