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The influence of He addition on Cl-etching procedure for Si-nanoscale structure fabrication using reactive ion etching system

✍ Scribed by M.Y. Jung; S.S. Choi; J.W. Kim; D.W. Kim


Book ID
117215459
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
363 KB
Volume
482-485
Category
Article
ISSN
0039-6028

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