The influence of design and process parameters on the reliability of CMOS integrated circuits : A. Aitken and P. Kung. Microelectron. Reliab. 17, 201 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 89 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90342-6