The influence of Büttiker probe scattering to the port behavior of nanoscale metal–oxide–semiconductor devices

✍ Scribed by Jian Xiong; Gen Wang; Wolfgang Mathis

• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 394 KB
• Volume: 41
• Category: Article
• ISSN: 0098-9886
• DOI: 10.1002/cta.1805