✦ LIBER ✦
The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs
✍ Scribed by M.A. Exarchos; G.J. Papaioannou; J. Jomaah; F. Balestra
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 293 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0026-2714
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