The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee

✍ Scribed by Grigg, C.; Wong, P.; Albrecht, P.; Allan, R.; Bhavaraju, M.; Billinton, R.; Chen, Q.; Fong, C.; Haddad, S.; Kuruganty, S.; Li, W.; Mukerji, R.; Patton, D.; Rau, N.; Reppen, D.; Schneider, A.; Shahidehpour, M.; Singh, C.

• Book ID: 115512936
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 913 KB
• Volume: 14
• Category: Article
• ISSN: 0885-8950
• DOI: 10.1109/59.780914