The hypergeometric distribution model for predicting the reliability of softwares : Huang Xi Zhi. Microelectron. Reliab.24, 11 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 128 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90054-x