𝔖 Bobbio Scriptorium
✦   LIBER   ✦

The hybrid contact–optical coordinate measuring system

✍ Scribed by Jerzy Sładek; Paweł M. Błaszczyk; Magdalena Kupiec; Robert Sitnik


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
699 KB
Volume
44
Category
Article
ISSN
0263-2241

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Optical substrate thickness measurement
✍ Nabeel A. Riza; Mumtaz Sheikh; Frank Perez 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 594 KB

Proposed and demonstrated is a simple few components non-contact thickness measurement system for optical quality semi-transparent samples such as Silicon (Si) and 6H Silicon Carbide (SiC) optical chips used for designing sensors. The instrument exploits a hybrid fiber-freespace optical design that