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The high resolution electron microscopy of twin interfaces in 2H and 18R martensites of CuAl alloys

✍ Scribed by F.C. Lovey; G. Van Tendeloo; J. Van Landuyt; S. Amelinckx

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the nature of various stacking defect

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