Electronic resistivity and deffect struc
Electronic resistivity and deffect structure of ฮฒ-LiAl as a function of temperature and composition
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L.N. Hall; T.O. Brun; G.W. Crabtree; J.E. Robinson; S. Susman; T. Tokuhiro
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Article
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1983
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Elsevier Science
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English
โ 275 KB