The Ground Plane in Buried Oxide for Controlling Short-Channel Effects in Nanoscale SOI MOSFETs

✍ Scribed by Jagadesh Kumar, M.; Siva, M.

• Book ID: 114619428
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 346 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.922859