The free-edge stress singularity at an interface between bilinear materials
โ Scribed by C. Chung; J.W. Eischen
- Book ID
- 103130142
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 554 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0020-7683
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
To clarify the mechanics of time-dependent crack initiation at an interface edge in submicron thick elements due to creep, delamination experiments are conducted using a micro-cantilever bend specimen with a tin/silicon interface edge. After the specimen time-dependently deforms under a constant loa
A stress singularity of type Kr" (6 < 0) exists at the interface corner between bonded elastic quarter planes. The intensity of this stress singularity, referred to here as the free-edge stress intensity factory K,, characterizes the magnitude of the stress state in the region of the interface corne