The applicability of models based on fractal geometry to characterize thin-Γlm surfaces was investigated. The fractal geometry of sputtered chromium nitride and silicon nitride thin-Γlm surfaces was described using Fourier spectral analysis of proΓles from scanning tunnelling microscopy images and a
β¦ LIBER β¦
The fractal character of carbon surfaces determined by Fourier analysis of STM data
β Scribed by H.F. Stoeckli; L. Currit
- Book ID
- 107727716
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 334 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0008-6223
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