✦ LIBER ✦
The formation of nanometer-scale gaps by electrical degradation and their application to C60 transport measurements
✍ Scribed by K. Tsukagoshi; E. Watanabe; I. Yagi; Y. Aoyagi
- Book ID
- 113797676
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 261 KB
- Volume
- 73-74
- Category
- Article
- ISSN
- 0167-9317
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