The failure rate function estimated from parameter drift measurements: Jorgen Moltoft. Microelectron. Reliab. 20, 787 (1980)

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 120 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(82)90101-9