✦ LIBER ✦
The failure mechanisms and phase formation for Ni, Co and Cu contacts on ion implanted (0 0 1)Si under high current stress
✍ Scribed by H.H Lin; S.L Cheng; L.J Chen
- Book ID
- 114163994
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 533 KB
- Volume
- 169
- Category
- Article
- ISSN
- 0168-583X
No coin nor oath required. For personal study only.