✦ LIBER ✦
The energy levels and the defect signature of sulfurimplanted silicon by thermally stimulated measurements : R. Y. Koyama, W. E. Phillips, R. Myers, Y. M. Liu and H. B. Dietrich. Solid-St. Electron.21, 953 (1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 64 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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