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The emission process of secondary ions from solids bombarded with large gas cluster ions

✍ Scribed by Satoshi Ninomiya; Kazuya Ichiki; Toshio Seki; Takaaki Aoki; Jiro Matsuo

Book ID
108224552
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
334 KB
Volume
267
Category
Article
ISSN
0168-583X

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πŸ“œ SIMILAR VOLUMES

Measurements of secondary ions emitted f
Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions
✍ Satoshi Ninomiya; Yoshihiko Nakata; Kazuya Ichiki; Toshio Seki; Takaaki Aoki; Ji πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 192 KB

We propose to use cluster ions that are much larger than the molecular ions as primary ions for organic secondary ion mass spectrometry. Incident Ar cluster ion beams with energies from 10 to 20 keV and a mean size of about 1000 atoms/cluster were used. Secondary ions were measured for a thin argini