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The electrical characterization of grain boundaries in ultra-fine grained Y-TZP

✍ Scribed by C.S. Chen; M.M.R. Boutz; B.A. Boukamp; A.J.A. Winnubst; K.J. de Vries; A.J. Burggraaf


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
340 KB
Volume
168
Category
Article
ISSN
0921-5093

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