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The effects of X-ray irradiation-induced damage on reliability in MOS structures

โœ Scribed by Shi-ho Kim; Ho-jun Lee; Chul-hi Han; Kwyro Lee; Sang-soo Choi; Young-jin Jeon; Enzo Di Fabrizio; Massimo Gentili


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
476 KB
Volume
38
Category
Article
ISSN
0038-1101

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