The effects of impurity redistribution on the subthreshold leakage current in CMOS n-channel transistors: Kjell. O. Jeppson and James L. Gates. Solid State Electronics19, 83 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 121 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90346-2