𝔖 Bobbio Scriptorium
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The effects of defects on the early failure of metal interconnects : Kevin G. Kemp, Kelvin F. Poole and David F. Frost. IEEE Trans. Reliab. 39(1), 26 (1990)


Book ID
103283010
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
131 KB
Volume
31
Category
Article
ISSN
0026-2714

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