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The effects of CO, H, NH3, CH3OH, H2O, and C2H4 on the electronic properties of ultrathin Cu films supported over Ru(0001): an XPS study

✍ Scribed by J.A Rodriguez; R.A. Campbell; J.S. Corneille; D.W. Goodman


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
648 KB
Volume
180
Category
Article
ISSN
0009-2614

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✦ Synopsis


The interaction of CO, H, NHg, CH,OH, H20, and C*H,, with ultrathin Cu films supported on Ru (000 1) has been studied by means of XPS and TPD. For films with O,,< I, adsorption ofC0, &X4, and H induced shifts of +0.5, +0.3, and +0.25 eV, respectively, in the Cu(2p,,,) peak position. Negligible shifts were observed upon adsorption of NHJ, CHsOH, and HZO. The XPS results are consistent with a model in which the electron density transferred from a Cu monolayer to the adsorbates follows the trend: CO> C2H4, H > NH3, CH,OH, HZO.


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