The effects of CO, H, NH3, CH3OH, H2O, and C2H4 on the electronic properties of ultrathin Cu films supported over Ru(0001): an XPS study
β Scribed by J.A Rodriguez; R.A. Campbell; J.S. Corneille; D.W. Goodman
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 648 KB
- Volume
- 180
- Category
- Article
- ISSN
- 0009-2614
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β¦ Synopsis
The interaction of CO, H, NHg, CH,OH, H20, and C*H,, with ultrathin Cu films supported on Ru (000 1) has been studied by means of XPS and TPD. For films with O,,< I, adsorption ofC0, &X4, and H induced shifts of +0.5, +0.3, and +0.25 eV, respectively, in the Cu(2p,,,) peak position. Negligible shifts were observed upon adsorption of NHJ, CHsOH, and HZO. The XPS results are consistent with a model in which the electron density transferred from a Cu monolayer to the adsorbates follows the trend: CO> C2H4, H > NH3, CH,OH, HZO.
π SIMILAR VOLUMES
The ab initio electronic structure calculations at the MP2 and the Becke Ε½ . 3LYP density functional levels in conjunction with the 6-311qqG 2 df, 2 pd basis set were used for the determination of the structure, vibrational spectra, and dissociation 2q 2q Ε½ . energies of the XH and XH X s C, Si, Ge