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The effect on yield and chip-area utilization of large fault-tolerant processor clusters

✍ Scribed by Afzel Noore

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 309 KB
Volume: 33
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(93)90029-x

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