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The effect of thickness on the dielectric properties of highly (111) oriented Pb(Zr0.53Ti0.47)O3 thin films prepared by a simple sol–gel route

✍ Scribed by X.G. Tang; L.L. Jiang; A.L. Ding


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
227 KB
Volume
65
Category
Article
ISSN
0167-9317

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Optical properties of Pb(Zr0.53Ti0.47)O3
✍ Y.P. Jiang; X.G. Tang; Q.X. Liu; Q. Li; A.L. Ding 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 740 KB

Pb(Zr 0.53 Ti 0.47 )O 3 (PZT) thin films grown on Pt-coated Si substrates were prepared by a sol-gel process. Crystalline structure characterisation and optical constants (refractive index n, extinction coefficient k) and bandgaps E g of PZT thin films annealed at 550, 600 and 650 • C were obtained