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The effect of thermal and radiation defects on the recombination properties of the base region of diffused silicon p-n structures : P. V. Kuchinskii and V. M. Lomako. Solid-St. Electron.29(10), 1041 (1986)


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
128 KB
Volume
27
Category
Article
ISSN
0026-2714

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