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The effect of the substrate on MOST and MOS-IC: mainly on the DC characteristics : Y. Hayashi and Y. Tarui. Abstracts Trans. Inst. Electron. Comm. Engrs Japan54, No. 5 (1971), p. 30

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 108 KB
Volume: 11
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(72)90638-5

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