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The effect of spatially varying diffusion constant on the transient decay of short circuit current in electron irradiated p−n junctions

✍ Scribed by Philip H. Hoff

Book ID: 107856185
Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 228 KB
Volume: 18
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(75)90168-9

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