The effect of series resistance on threshold voltage measurement techniques for fully depleted SOI MOSFETs

✍ Scribed by S.P. Wainwright; S. Hall; D. Flandre

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 456 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(95)00120-i