✦ LIBER ✦
The effect of post-implantation annealing temperature on the deep states present in SIMOX MOSFET’s as observed using enhancement mode current DLTS
✍ Scribed by P. K. McLarty; D. E. Ioannou; H. L. Hughes
- Book ID
- 112816329
- Publisher
- Springer US
- Year
- 1990
- Tongue
- English
- Weight
- 356 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0361-5235
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