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The effect of non-stoichiometry on the implantation of ytterbium in cadmium telluride

✍ Scribed by Bryant, F. J.; Namum, J.

Book ID
127376337
Publisher
Informa UK (Taylor & Francis)
Year
1977
Weight
732 KB
Volume
31
Category
Article
ISSN
0033-7579

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## Abstract Secondary ion mass spectrometry (SIMS) requires the preparation and measurement of standard samples in order to be considered a quantitative technique. This normally can be achieved by the production of ion‐implanted specimens in the matrix to be studied. The measured SIMS depth profile