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The effect of noise in a single-item localization and identification task

✍ Scribed by A.H.C Van der Heijden; R.F.T Brouwer


Book ID
113967702
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
86 KB
Volume
103
Category
Article
ISSN
0001-6918

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## Abstract In this paper the effects of different noise sources in a four‐gate field‐effect‐transistor have been studied and quantified in different operation regimes of the structure. To carry out this study, a model that captures the main features of generation–recombination noise, produced by t